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JOURNAL OF APPLIED PHYSICS VOLUME 90, NUMBER 7 1 OCTOBER 2001
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Document Date: 2002-11-26 18:15:21


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P. J. Kindlmann A. E. / D. E. Prober A. E. / /

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American Institute of Physics Downloaded / American Institute of Physics / S. H. Moseley NASA Goddard Space Flight Center / Yale University / /

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average energy resolution / predicted energy resolution / corrected experimental energy resolution / measured energy broadening / higher energy gap material / photon energy / energy gap / degraded energy resolution / electron-hole excitation energy / 1D spatial imaging / higher energy range / x-ray single photon imaging spectrometers / energy broadening / larger energy gap / improved single-photon imaging x-ray spectrometers / Energy spectrum / device energy width / energy resolution / energy width / earlier devices / lower energy gap / energy / /

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S. H. Moseley NASA Goddard Space Flight Center / American Institute of Physics Downloaded / American Institute of Physics / A. E. Szymkowiak and S. H. Moseley NASA Goddard Space Flight Center / National Aeronautics and Space Administration / Yale University / /

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R. Schoelkopf / S. Friedrich / H. Netel / A. T. Barfknecht / M. A. Lideman / S. E. Labov / D. Chow / M. Devoret / K. Segall / C. A. Mears / /

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Maryland / Connecticut / /

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semiconductor / semiconductors / x-ray / recombination / /

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http /

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