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Noise / Electronic engineering / Shot noise / Johnson–Nyquist noise / Biasing / Superconducting tunnel junction / Electromagnetism / Electrical engineering / Physics
Date: 2000-07-05 21:47:59
Noise
Electronic engineering
Shot noise
Johnson–Nyquist noise
Biasing
Superconducting tunnel junction
Electromagnetism
Electrical engineering
Physics

APPLIED PHYSICS LETTERS VOLUME 76, NUMBER[removed]JUNE 2000

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