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Pure & Appl. Chem., Vol. 70,No. 7, pp, 1998. Printed in Great BritainIUPAC INTERNATIONAL UNION OF PURE AND APPLIED CHEMISTRY
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Document Date: 2004-06-03 12:11:21

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Madrid / Dresden / Lawrence / /

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YE AE / /

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Taiwan / Switzerland / Germany / Hungary / Netherlands / Italy / Bulgaria / Sweden / Turkey / France / Japan / Russia / Austria / United States / Brazil / Canada / Portugal / United Kingdom / Israel / Argentina / Yugoslavia / South Korea / Spain / India / /

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USD / /

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University of Kansas / /

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metal electrode / metal mesh / metal electrodes / chemical reaction / reactant solution / semi-infinite media / energy / metal / chemical potential gradients / thin metal film / metal film / chemical reactions / typical applications / chemical composition / free electron gas / /

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Fermi / /

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COMMISSION ON ELECTROCHEMISTRY Measurements / IUPAC INTERNATIONAL UNION OF PURE AND APPLIED CHEMISTRY PHYSICAL CHEMISTRY DIVISION COMMISSION ON ELECTROCHEMISTRY* SPECTROELECTROCHEMISTRY / COMMISSION ON ELECTROCHEMISTRY / African Union / University of Kansas / relevant IUPAC National Adhering Organization / Technische Universitat Dresden / /

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RAY TECHNIQUES / Z. Samec / M. A. Brett / /

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Secretary / Chairman / /

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Kansas / Nebraska / /

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Pure and Applied Chemistry / /

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semiconductor / radiation / X-RAY / MICROWAVE / Laser / semiconductors / Lasers / artificial intelligence / dielectric / Spectroscopy / ELECTROCHEMISTRY / electrochemical cell / /

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