Toggle navigation
PDFSEARCH.IO
Document Search Engine - browse more than 18 million documents
Sign up
Sign in
Back to Results
First Page
Meta Content
View Document Preview and Link
SISPAD 2012, September 5-7, 2012, Denver, CO, USA Strain engineering in MOS and Tunnel FETs: models, challenges and opportunities. David Esseni DIEGM - University of Udine, Via delle Scienze 208, 33100 Udine, Italy
Add to Reading List
Document Date: 2013-02-12 08:39:11
Open Document
File Size: 78,34 KB
Share Result on Facebook