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Thin film deposition / Agile software development / MKS Integrity / Software project management / Thin film / Calibration / Pressure measurement / Atomic layer deposition / Measurement / Technology / Software development


Atomic Layer Deposition (ALD) Process Solutions from MKS Instruments
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Document Date: 2011-10-14 10:03:01

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File Size: 1,10 MB

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City

Andover / /

Company

Society Inc. / MKS Instruments Inc. / ALD Process Solutions / O3MEGA / /

Country

United States / /

Event

Reorganization / /

IndustryTerm

process control solutions / telephone support / technology set / purge gas delivery systems / process applications / chemical properties / precursor gas composition / applicationspecific technologies / process equipment / information management / precursor chemicals / leadingedge solutions / manufacturing / gas composition monitoring / chemical / technology leadership / reactive gas generation / chemicals / gas phase / vacuum technology / /

/

Position

worldwide leader in the development / /

Product

628D Baratron / /

ProvinceOrState

Massachusetts / /

Technology

semiconductor / vacuum technology / condensation / process control / two applicationspecific technologies / /

URL

www.mksinst.com / /

SocialTag