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An Empirical Study on the Fault-Proneness of Clone Migration in Clone Genealogies Shuai Xie1 , Foutse Khomh2 , Ying Zou1 , Iman Keivanloo1 1 Department of Electrical and Computer Engineering, Queen’s University, Canad
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Document Date: 2013-12-02 19:52:54
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File Size: 318,35 KB
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