![Electromagnetic radiation / Nanotechnology / Chemistry / Spectroscopy / Ellipsometry / Radiometry / Analytical chemistry / Wafer / Metrology / Materials science / Physics / Semiconductor device fabrication Electromagnetic radiation / Nanotechnology / Chemistry / Spectroscopy / Ellipsometry / Radiometry / Analytical chemistry / Wafer / Metrology / Materials science / Physics / Semiconductor device fabrication](https://www.pdfsearch.io/img/35351959cd23d33c1d7ab6d4600ab089.jpg)
| Document Date: 2015-06-08 13:40:52 Open Document File Size: 319,33 KBShare Result on Facebook
City Erlangen / / Company Integrated Systems / / Country Germany / / / Facility Characterization Fraunhofer Institute / / / IndustryTerm flatness structure measurement tools / chemical contamination / analytical equipment / rf-technology / plasma immersion implantation equipment / measurement systems / energy / / Organization Characterization Fraunhofer Institute for Integrated Systems / / Person Martin Schellenberger Competences / Georg Roeder / / / Technology spectroscopy / simulation / X-ray / Process Control / / URL www.iisb.fraunhofer.de / /
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