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Science / Wafer testing / Wafer / Synopsys / Statistics / Semiconductor device fabrication / Information / Data


Datasheet YieldManager Customizable Yield Management for IC Manufacturers Overview
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Document Date: 2014-11-07 14:34:46


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File Size: 4,58 MB

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ABC / Oracle / Synopsys Inc. / Magma / Microsoft / /

Country

United States / /

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M&A / /

Facility

Interactive gallery / /

IndustryTerm

industry-proven solution / process tool / data equipment / versatile tools / data conversion tools / semiconductor manufacturing environment / real-time identification / process equipment / yield correlation using defectivity analysis equipment / automatic test equipment / fab manufacturing infrastructure / inspection tools / in-line fab defect-centric yield solutions / communication protocols / inline review tools / fab manufacturing data / multiprocessor systems / wafer fab defect centric solution / client-server applications / performance and hardware / Online help / defect analysis systems / /

OperatingSystem

UNIX / Windows 7 / Linux / Microsoft Windows / Windows 2008 / /

Person

Lot Figure / /

Position

Smart Sampling™ Yield Manager / yield engineer / Manager Defect Management System Smart Sampling / /

Product

Knights product line / Knights / /

ProgrammingLanguage

HTML / VB / /

Technology

semiconductor / Linux / UNIX / SAN / gigabit / operating system / communication protocols / HTML / GUI / /

URL

www.synopsys.com / http /

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