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REVIEW OF SCIENTIFIC INSTRUMENTS 80, 083302 共2009兲 A fast, direct x-ray detection charge-coupled device P. Denes,1 D. Doering,1 H. A. Padmore,2 J.-P. Walder,1 and J. Weizeorick3 1
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Document Date: 2010-06-14 14:13:12


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City

Berkeley / /

Company

Argonne National Laboratory / Lawrence Berkeley National Laboratory / Dalsa Semiconductor / LBNL Microsystems Laboratory / /

Country

United States / /

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USD / /

Facility

LBNL Microsystems Laboratory / American Institute of Physics / /

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external equipment / metal / energy-ordered sum / test devices / front-end processing / metal etching steps / energy-measuring / minimum metal-strapped pixel pitch / backside processing / readout systems / metal oxide semiconductor / metal strapping / back end electronics / optical imaging / analog services / low energy electrons / energy / /

Organization

American Institute of Physics / Matthew Church / /

Person

Bill Kolbe / Robert Abiad / R. J. Stover / C. R. Pennypacker / M. Wei / Rossana Cambie / Steve Holland / W. W. Moses / N. Palaio / N. P. Palaio / N. W. Wang / Tim Madden / Brad Krieger / Dario Gnani / Geroge Chao / S. Perlmutter / John Eames / Rhonda Whitharm / G. Goldhaber / Chris Bebek / Armin Karcher / Antonino Miceli / Jacque Wycoff / /

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RT / /

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Archos TV+ Portable Video Player (PVP) / /

ProvinceOrState

Illinois / California / /

PublishedMedium

REVIEW OF SCIENTIFIC INSTRUMENTS / /

Technology

semiconductor / FPGA / radiation / analog to digital converter / ADC / x-ray / integrated circuits / GUI / integrated circuit / CCD chip / /

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http /

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