| Document Date: 2010-06-14 17:10:48
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Company CTI / Lawrence Berkeley National Laboratory / Jonathan Thacker Lawrence Berkeley National Laboratory / ACS / Space Sciences Laboratory / / Country United States / / / Event Product Issues / / Facility Space Sciences Laboratory / University of California / BASE facility / / IndustryTerm energy levels / n-channel devices / pchannel devices / µm thick devices / energy level / e- / / low-energy proton irradiation / low-energy proton radiation / fitted mean energy / e-) / correction algorithms / trap energy / activation energy / low-energy protons / energy / software correction / trap site / / NaturalFeature p+ channel / / Organization University of California / Berkeley / U.S. Securities and Exchange Commission / Joint Dark Energy Mission / / Person Nick J. Mostek / Christopher J. Bebek / William F. Kolbe / / / Product n-channel devices.1 Any disruption / / ProvinceOrState California / / Technology radiation / x-ray / correction algorithms / /
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Charge trap identification for proton-irradiated p+ channel CCDs Nick J. Mostek, Christopher J. Bebek, Armin Karcher, William F. Kolbe, Natalie A. Roe, Jonathan Thacker Lawrence Berkeley National Laboratory, Berkeley, CA