A Compact Model Methodology for Device Design Uncertainty R. Q. Williams, J. S. Watts, M-H. Na, K. Bernstein IBM Microelectronics 1000 River Road, M S 972F, Essex Junction, Vermont, 05452, USA - Williams Junction - Document - PDFSEARCH.IO

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	A Compact Model Methodology for Device Design Uncertainty R. Q. Williams, J. S. Watts, M-H. Na, K. Bernstein IBM Microelectronics 1000 River Road, M/S 972F, Essex Junction, Vermont, 05452, USA Add to Reading List Document Date: 2010-03-19 15:28:38 Open Document File Size: 1,85 MB Share Result on Facebook Company IBM / / / NaturalFeature Long channel / Function Long channel / Short channel / / Person Max N Ids / / Position transistor designer / / Technology VSAT / Scaled ULSI technologies / / SocialTag Electronics Technology Electronic engineering Transistor model Very-small-aperture terminal

A Compact Model Methodology for Device Design Uncertainty R. Q. Williams, J. S. Watts, M-H. Na, K. Bernstein IBM Microelectronics 1000 River Road, M/S 972F, Essex Junction, Vermont, 05452, USAAdd to Reading List