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![]() Date: 2015-01-10 06:34:49Integrated circuits Automatic test pattern generation Linear-feedback shift register Built-in self-test Scan chain Hardware Trojan | Add to Reading List |
![]() | Ridgetop Group, IncNorth Oracle Road Tucson, AZPhone: Fax: www.RidgetopGroup.comDocID: 1rq2g - View Document |
![]() | FOR IMMEDIATE RELEASE Ridgetop Group, IncNorth Oracle Road Tucson, AZPhone:DocID: 1r5Xr - View Document |
![]() | TSV BIST™: An Innovative Method for 2.5D/3D IC Interconnection Integrity Monitoring Hans Manhaeve, Ph.D. Ridgetop Europe, n.v. L. Bauwensstraat 20, B-8200 Brugge, BelgiumDocID: 1pMqA - View Document |
![]() | Ridgetop Group, IncNorth Oracle Road Tucson, AZPhone: (Fax: (www.RidgetopGroup.comDocID: 1pxep - View Document |
![]() | ISSN No: International Journal & Magazine of Engineering, Technology, Management and Research A Peer Reviewed Open Access International JournalDocID: 1pvKr - View Document |