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Diffraction / Measuring instruments / Optics / X-rays / Crystallography / X-ray crystal truncation rod / Diffractometer / Laser beam profiler / Flat-field correction / Scientific method / Physics / Science


research papers Acta Crystallographica Section A Foundations of Crystallography
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Document Date: 2013-04-08 08:52:46

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File Size: 2,91 MB

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City

Amsterdam / Villigen / New York / /

Company

John Wiley and Sons / Patterson / /

Country

Germany / Switzerland / Netherlands / /

/

Facility

Paul Scherrer Institute / University of Hamburg / /

IndustryTerm

crystalline systems / synchrotron photon energy / detector technology superior / Software algorithms / adapted readout electronics / energy range / intrinsic energy resolution / transitionmetal and complex metal oxide surfaces / energy / sample mounting equipment / /

Organization

International Union of Crystallography Printed in Great Britain / University of Hamburg / Department of Physics / Paul Scherrer Institute / /

Position

model of a surface region / D. J. / representative / Walker / /

Region

North Holland / /

Technology

radiation / X-ray / Software algorithms / /

URL

http /

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