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X-ray reflectivity / Reflectivity / Wafer / Polystyrene / Physics / Science / Semiconductor device fabrication / Chemistry / Polymer


Surface and Interface 17A, 17C/2002G043 Morphology of Polystyrene Surface near Glass transition Temperature; X-ray Reflectivity Study
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Document Date: 2010-01-05 10:30:35

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File Size: 49,43 KB

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Company

Fujitsu Laboratories Ltd. / /

Country

Japan / /

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Facility

Kwansei Gakuin University / /

Organization

School of Science and Engineering / Advanced Research Center of Science / Kwansei Gakuin University / /

Technology

biomaterials / X-ray / /

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