![X-ray reflectivity / Science / National Institute of Standards and Technology / Atomic layer deposition / Metrology / Thin film / Wafer / Chemistry / Manufacturing / Thin film deposition / Semiconductor device fabrication / Optics X-ray reflectivity / Science / National Institute of Standards and Technology / Atomic layer deposition / Metrology / Thin film / Wafer / Chemistry / Manufacturing / Thin film deposition / Semiconductor device fabrication / Optics](https://www.pdfsearch.io/img/9ccd46730bc5f0d850240493fadfad32.jpg)
| Document Date: 2012-10-04 11:43:22 Open Document File Size: 192,30 KBShare Result on Facebook
City Denver / / Company Engineering Laboratory / NIST / Diebold / ISMI Advanced CD Metrology Advisory Group / International SEMATECH Manufacturing / / Country United States / / Currency USD / / / Event Business Partnership / / Facility XRR laboratory / / IndustryTerm microelectronic devices / smooth deposition processing / measurement tools / manufacturing / Online Proceedings / technology transfers / analysis software / / NaturalFeature Jordan Valley / / Organization Ceramics Division / / Person David L. Gil / James P. Cline Albert Henins David / L. Gil Windover / Donald Windover / / / Product SI / / Technology semiconductor / X-ray / / URL www.nist.gov/ceramics / /
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