Back to Results
First PageMeta Content
X-ray reflectivity / Gloss / Reflectivity / Scattering / Reflection / Specular reflection / X-ray scattering techniques / Refractive index / Transfer-matrix method / Physics / Optics / Geometrical optics


X-Ray and Neutron Reflectivity for the Investigation of Thin Films – A Short Tutorial – Frank Schreiber, Alexander Gerlach, Physical and Theoretical Chemistry Laboratory, Oxford University, South Parks Road, Oxford O
Add to Reading List

Document Date: 2012-02-02 12:42:59

Open Document

File Size: 376,07 KB

Share Result on Facebook

City

Berlin / /

Company

Soft-Matter Thin Films / Theoretical Chemistry Laboratory / /

Facility

Oxford University / /

IndustryTerm

chemical element / /

Organization

U.S. Securities and Exchange Commission / Oxford University / /

Person

Frank Schreiber / Ray Scattering / F. Schreiber / V / Alexander Gerlach / /

Technology

radiation / Parratts algorithm / X-Ray / Simulation / /

URL

www.physchem.ox.ac.uk/~fs / /

SocialTag