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Diffraction / Optics / X-ray reflectivity / Reflectivity / X-ray scattering techniques / X-ray / Scientific method / Science / Physics


JOURNAL OF APPLIED PHYSICS VOLUME 84, NUMBER 4 15 AUGUST 1998
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Document Date: 2010-06-28 16:02:40

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City

Physics / Cantoblanco / Orsay / London / New York / Grenoble / /

Company

W. Press / Cu and Co. / G. Verbank / Ge / Siemens / /

Country

France / Japan / Spain / /

Currency

USD / CRC / /

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Facility

American Institute of Physics Downloaded / Sasaki Tables ~National Laboratory / European Synchrotron Radiation Facility / American Institute of Physics / /

IndustryTerm

metal / actual solution / possible solution / incident energy / stainless steel screens / chemical modulation / energy / /

Organization

American Institute of Physics Downloaded / American Institute of Physics / ~National Laboratory for High Energy Physics / Instituto de Ciencia de Materiales de Madrid / E. Fischer Institut Max / A. de Bernabe´ Instituto de Ciencia de Materiales de Madrid / U.S. Securities and Exchange Commission / /

Person

Bessie / Van Dau / Lefebvre / Paul Langevin / /

Position

CoO / /

Product

B 47 / /

ProgrammingLanguage

ML / /

ProvinceOrState

New York / /

Technology

semiconductor / Radiation / x-ray / spectroscopy / simulation / /

URL

http /

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