| Document Date: 2014-04-24 12:02:26
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City Uccio / New York / / Company Wen L. P. / Wilson / Cambridge University Press / Diebold / / Country United Kingdom / United States / / / Facility UniVersity of Virginia / Hall Model / / IndustryTerm charge carrier concentration / wide and important applications / carrier traps / generated energy / carrier annihilation / rate law / charge carrier recombination kinetics / carrier generation / e-h / carrier recombination / studied metal oxides / energy / Low-energy electron-diffraction / / Organization Cambridge University / UniVersity of Virginia / Defense Threat Reduction Agency / Department of Chemistry / / Person John T. Yates / Jr. / Zhen Zhang / / ProvinceOrState Virginia / / Technology semiconductor / spectroscopy / Recombination / /
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3098 J. Phys. Chem. C 2010, 114, 3098–3101 Direct Observation of Surface-Mediated Electron-Hole Pair Recombination in TiO2(110) Zhen Zhang and John T. Yates, Jr.*