SISPAD 2012, September 5-7, 2012, Denver, CO, USA Modeling and Analysis of the Parasitic Series Resistance in Raised Source Drain FinFETs with Polygonal Epitaxy Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun - Resistance - Document - PDFSEARCH.IO

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Date: 2013-02-12 08:39:10		SISPAD 2012, September 5-7, 2012, Denver, CO, USA Modeling and Analysis of the Parasitic Series Resistance in Raised Source/Drain FinFETs with Polygonal Epitaxy Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun Add to Reading List Source URL: in4.iue.tuwien.ac.at Download Document from Source Website File Size: 629,51 KB Share Document on Facebook