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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Modeling and Analysis of the Parasitic Series Resistance in Raised Source/Drain FinFETs with Polygonal Epitaxy Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun
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Document Date: 2013-02-12 08:39:10
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SISPAD 2012, September 5-7, 2012, Denver, CO, USA Modeling and Analysis of the Parasitic Series Resistance in Raised Source/Drain FinFETs with Polygonal Epitaxy Chang-Woo Sohn, Chang Yong Kang, Rock-Hyun