Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical

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Date: 2012-11-16 19:15:37 Technology Atomic force microscopy Scanning tunneling microscope Haptic technology AFM probe Contact mechanics Test probe Piezoelectricity Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method		Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Add to Reading List Source URL: nanolab.me.cmu.edu Download Document from Source Website File Size: 1,03 MB Share Document on Facebook

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