![Technology / Atomic force microscopy / Scanning tunneling microscope / Haptic technology / AFM probe / Contact mechanics / Test probe / Piezoelectricity / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method Technology / Atomic force microscopy / Scanning tunneling microscope / Haptic technology / AFM probe / Contact mechanics / Test probe / Piezoelectricity / Photoconductive atomic force microscopy / Scanning probe microscopy / Science / Scientific method](https://www.pdfsearch.io/img/b51ef6dea69822b9ca732fb36801c712.jpg)
| Document Date: 2012-11-16 19:15:37 Open Document File Size: 1,03 MBShare Result on Facebook
Company T M s A / / Country United States / / Facility Institute Engineering Department / University of Tokyo / Carnegie Mellon University / / IndustryTerm haptic device / haptic master device / on-line information / direct teleoperation technology / real-time imaging / d.o.f. force feedback master device / tele-nanorobotics applications / slave site / imaging / far-field real-time imaging / / OperatingSystem Aix / / Organization University of Tokyo / Carnegie Mellon University / Institute Engineering Department / / Person Metin Sitti / / Position Bilateral teleoperation controller / Prime Minister / controller / a PD controller / designer / / Product Pentax K-x Digital Camera / / Technology direct teleoperation technology / 3-D / Virtual Reality / /
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