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Date: 2014-04-02 07:22:03 Embedded systems IEEE standards Electronic engineering Joint Test Action Group Microcontrollers Boundary scan Debugger Field-programmable gate array Atmel AVR Electronics manufacturing Manufacturing Electronics		www.xjtag.com XJInvestigator Overview Add to Reading List Source URL: www.xjtag.com Download Document from Source Website File Size: 331,25 KB Share Document on Facebook

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