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Embedded systems / IEEE standards / Electronic engineering / Joint Test Action Group / Microcontrollers / Boundary scan / Debugger / Field-programmable gate array / Atmel AVR / Electronics manufacturing / Manufacturing / Electronics


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Document Date: 2014-04-02 07:22:03

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manufacturing problems / /

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nets / components / pins / /

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Flash / FPGA / JTAG / RAM / /

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