![Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing](https://www.pdfsearch.io/img/5cc2278834faeb924337c7a76cf5c1e8.jpg) Date: 2014-06-16 15:59:17Manufacturing Joint Test Action Group Boundary scan Scan chain Test compression Automatic test pattern generation Block cipher Man-in-the-middle attack Side channel attack Electronic engineering Electronics Electronics manufacturing | | IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING Received 30 April 2013; revised 6 October 2013; accepted 22 December[removed]Date of publication 5 February 2014; date of current version 7 May 2014.Add to Reading ListSource URL: www.computer.orgDownload Document from Source Website File Size: 1,79 MBShare Document on Facebook
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