![Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing Manufacturing / Joint Test Action Group / Boundary scan / Scan chain / Test compression / Automatic test pattern generation / Block cipher / Man-in-the-middle attack / Side channel attack / Electronic engineering / Electronics / Electronics manufacturing](https://www.pdfsearch.io/img/5cc2278834faeb924337c7a76cf5c1e8.jpg)
| Document Date: 2014-06-16 15:59:17 Open Document File Size: 1,79 MBShare Result on Facebook
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