![Mass spectrometry / Ions / Particle accelerators / Semiconductor device fabrication / Thin film deposition / Ion source / Ion beam / Electron / Accelerator mass spectrometry / Chemistry / Physics / Scientific method Mass spectrometry / Ions / Particle accelerators / Semiconductor device fabrication / Thin film deposition / Ion source / Ion beam / Electron / Accelerator mass spectrometry / Chemistry / Physics / Scientific method](https://www.pdfsearch.io/img/051e04a6de0d16ee976ada3b193cbe3f.jpg) Date: 2010-09-20 14:03:09Mass spectrometry Ions Particle accelerators Semiconductor device fabrication Thin film deposition Ion source Ion beam Electron Accelerator mass spectrometry Chemistry Physics Scientific method | | The effect of matrix electron affinity on ion beam currents for BeO analysis A.L. Hunt, G.A. Petrucci: Department of Chemistry, University of Vermont; P.R. Bierman Department of Geology and School of Natural Resources, UAdd to Reading ListSource URL: www.uvm.eduDownload Document from Source Website File Size: 40,87 KBShare Document on Facebook
|