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Mass spectrometry / Ions / Particle accelerators / Semiconductor device fabrication / Thin film deposition / Ion source / Ion beam / Electron / Accelerator mass spectrometry / Chemistry / Physics / Scientific method
Date: 2010-09-20 14:03:09
Mass spectrometry
Ions
Particle accelerators
Semiconductor device fabrication
Thin film deposition
Ion source
Ion beam
Electron
Accelerator mass spectrometry
Chemistry
Physics
Scientific method

The effect of matrix electron affinity on ion beam currents for BeO analysis A.L. Hunt, G.A. Petrucci: Department of Chemistry, University of Vermont; P.R. Bierman Department of Geology and School of Natural Resources, U

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