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Mass spectrometry / Ions / Particle accelerators / Semiconductor device fabrication / Thin film deposition / Ion source / Ion beam / Electron / Accelerator mass spectrometry / Chemistry / Physics / Scientific method


The effect of matrix electron affinity on ion beam currents for BeO analysis A.L. Hunt, G.A. Petrucci: Department of Chemistry, University of Vermont; P.R. Bierman Department of Geology and School of Natural Resources, U
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Document Date: 2010-09-20 14:03:09


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File Size: 40,87 KB

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University of Vermont / /

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geochronologic applications / metal powder matrix / /

Organization

University of Vermont / Center for Accelerator Mass Spectrometry / P.R. Bierman Department of Geology / School of Natural Resources / Department of Chemistry / /

Person

Lawrence Livermore / /

ProvinceOrState

Vermont / /

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