![Statistical mechanics / Statistics / Process management / Sensitivity analysis / Monte Carlo method / Bipolar junction transistor / Statistical model / Scientific modeling / Science / Probability and statistics Statistical mechanics / Statistics / Process management / Sensitivity analysis / Monte Carlo method / Bipolar junction transistor / Statistical model / Scientific modeling / Science / Probability and statistics](https://www.pdfsearch.io/img/e7734aeb173efcceda080d7b720fd708.jpg) Date: 2010-03-19 15:37:55Statistical mechanics Statistics Process management Sensitivity analysis Monte Carlo method Bipolar junction transistor Statistical model Scientific modeling Science Probability and statistics | | On the correlations between model process parameters in statistical modeling Jiří Slezák, Aleš Litschmann, Stanislav Banáš, Radim Mlčoušek, Martin Kejhar SCG Czech Design Center, ON Semiconductor Czech Republic, Add to Reading ListSource URL: www.nsti.orgDownload Document from Source Website File Size: 347,76 KBShare Document on Facebook
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