Toggle navigation
PDFSEARCH.IO
Document Search Engine - browse more than 18 million documents
Sign up
Sign in
Back to Results
First Page
Meta Content
View Document Preview and Link
On the correlations between model process parameters in statistical modeling Jiří Slezák, Aleš Litschmann, Stanislav Banáš, Radim Mlčoušek, Martin Kejhar SCG Czech Design Center, ON Semiconductor Czech Republic,
Add to Reading List
Document Date: 2010-03-19 15:37:55
Open Document
File Size: 347,76 KB
Share Result on Facebook
City
Boston /
Radhoštěm /
/
Facility
Martin Kejhar SCG Czech Design Center /
/
IndustryTerm
e-parameters /
e-space /
/
Organization
Czech Design Center /
/
Person
Stanislav Banáš /
/
/
Position
Simulated collector /
collector /
/
Technology
process control /
Simulation /
/
SocialTag
Statistical mechanics
Statistics
Process management
Sensitivity analysis
Monte Carlo method
Bipolar junction transistor
Statistical model
Scientific modeling
Science
Probability and statistics
On the correlations between model process parameters in statistical modeling Jiří Slezák, Aleš Litschmann, Stanislav Banáš, Radim Mlčoušek, Martin Kejhar SCG Czech Design Center, ON Semiconductor Czech Republic,