Date: 2014-08-11 17:30:55

Microscopes

Electron beam

X-rays

Electron microscope

Transmission electron microscopy

Electron microprobe

Annular dark-field imaging

Scanning transmission electron microscopy

Scientific method

Electron microscopy

Science

Jeol JEM-2800 Transmission Electron Microscope The JEM-2800 is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEM

Document is deleted from original location.
Use the Download Button below to download from the Web Archive.

File Size: 556,17 KB