Annular dark-field imaging

Results: 5



#Item
1Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics University

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Source URL: jur.phy.uic.edu

Language: English - Date: 2012-05-25 16:52:49
2Jeol JEM-2800 Transmission Electron Microscope The JEM-2800 is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEM

Jeol JEM-2800 Transmission Electron Microscope The JEM-2800 is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEM

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Source URL: www.nanofab.utah.edu

Language: English - Date: 2014-08-11 17:30:55
3Practical module Scanning electron microscopy Goals • • •

Practical module Scanning electron microscopy Goals • • •

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Source URL: www.mic.unibe.ch

Language: English - Date: 2014-02-27 10:37:47
4doi:j.micron

doi:j.micron

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Source URL: www.physics.emory.edu

Language: English - Date: 2014-01-31 15:00:57
5doi:[removed]j.ssc[removed]

doi:[removed]j.ssc[removed]

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Source URL: www.emat.ua.ac.be

Language: English - Date: 2006-12-07 06:06:04