Annular dark-field imaging
Results: 5
# | Item |
---|---|
1![]() | Journal of Undergraduate Research 5, The Dependence of Sample Thickness on Annular Bright Field Microscopy M. M. G. Latting, W. Walkosz, and R. F. Klie Nanoscale Physics Group- Department of Physics UniversityAdd to Reading ListSource URL: jur.phy.uic.eduLanguage: English - Date: 2012-05-25 16:52:49 |
2![]() | Jeol JEM-2800 Transmission Electron Microscope The JEM-2800 is a high throughput nano-analysis TEM with automated functions Operation Modes: • TEMAdd to Reading ListSource URL: www.nanofab.utah.eduLanguage: English - Date: 2014-08-11 17:30:55 |
3![]() | Practical module Scanning electron microscopy Goals • • •Add to Reading ListSource URL: www.mic.unibe.chLanguage: English - Date: 2014-02-27 10:37:47 |
4![]() | doi:j.micronAdd to Reading ListSource URL: www.physics.emory.eduLanguage: English - Date: 2014-01-31 15:00:57 |
5![]() | doi:[removed]j.ssc[removed]Add to Reading ListSource URL: www.emat.ua.ac.beLanguage: English - Date: 2006-12-07 06:06:04 |