![Electron microscope / Scanning electron microscope / Scanning transmission electron microscopy / Environmental scanning electron microscope / Transmission electron microscopy / Microscope / Annular dark-field imaging / Gaseous detection device / Microscopy / Electron microscopy / Scientific method / Science Electron microscope / Scanning electron microscope / Scanning transmission electron microscopy / Environmental scanning electron microscope / Transmission electron microscopy / Microscope / Annular dark-field imaging / Gaseous detection device / Microscopy / Electron microscopy / Scientific method / Science](https://www.pdfsearch.io/img/90afa06c151b716e026939c3f8ac20bb.jpg)
| Document Date: 2014-01-31 15:00:57 Open Document File Size: 1,37 MBShare Result on Facebook
City Villeurbanne Cedex / Solaize Cedex / Berlin / Lyon / / Company STEM / FEI Company / BP / Cambridge University Press / IOP Publishing / ESEM Research Laboratory / Electroscan / Elsevier Ltd. / Philips / / Country France / Australia / / / Event M&A / / Facility GEMPPM laboratory / / / IndustryTerm limited applications / heavy metal compounds / gas molecules / energy spread / gas acts / low-vacuum systems / electron microscope manufacturer / electro-optical correcting devices / energy loss / annular dark-field imaging conditions / biological applications / dark-field imaging / signal processing / frequent energy losses / energy loss yield / highresolution imaging / imaging / aqueous solution / structural and chemical information / electron energy / energy / present device / annular dark-field imaging mode / potential applications / transmission imaging / high-energy electrons / signal-gas interaction / energy loss interval / darkfield imaging / narrow energy distribution / low-energy imaging / manufacturing world / brightfield imaging / present imaging conditions / electronics / developed imaging mode / gaseous detection device / microscope manufacturer / low-energy / presented imaging mode / gas purge / / Organization Cambridge University / Royal Society of U.K. With / Centre de Recherche de Solaize / / Person Donald / David Joy / de Broglie / Nixon / Bradley Thiel / Cameron / / / Position collector / SVP / Corresponding author / physicist / electrical charge conductor / / Product Hurricane software / Hurricane / / Technology semiconductor / condensation / simulation / / URL www.elsevier.com/locate/micron / /
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