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Electron microscope / Scanning electron microscope / Scanning transmission electron microscopy / Environmental scanning electron microscope / Transmission electron microscopy / Microscope / Annular dark-field imaging / Gaseous detection device / Microscopy / Electron microscopy / Scientific method / Science


doi:j.micron
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Document Date: 2014-01-31 15:00:57


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File Size: 1,37 MB

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City

Villeurbanne Cedex / Solaize Cedex / Berlin / Lyon / /

Company

STEM / FEI Company / BP / Cambridge University Press / IOP Publishing / ESEM Research Laboratory / Electroscan / Elsevier Ltd. / Philips / /

Country

France / Australia / /

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Event

M&A / /

Facility

GEMPPM laboratory / /

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IndustryTerm

limited applications / heavy metal compounds / gas molecules / energy spread / gas acts / low-vacuum systems / electron microscope manufacturer / electro-optical correcting devices / energy loss / annular dark-field imaging conditions / biological applications / dark-field imaging / signal processing / frequent energy losses / energy loss yield / highresolution imaging / imaging / aqueous solution / structural and chemical information / electron energy / energy / present device / annular dark-field imaging mode / potential applications / transmission imaging / high-energy electrons / signal-gas interaction / energy loss interval / darkfield imaging / narrow energy distribution / low-energy imaging / manufacturing world / brightfield imaging / present imaging conditions / electronics / developed imaging mode / gaseous detection device / microscope manufacturer / low-energy / presented imaging mode / gas purge / /

Organization

Cambridge University / Royal Society of U.K. With / Centre de Recherche de Solaize / /

Person

Donald / David Joy / de Broglie / Nixon / Bradley Thiel / Cameron / /

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Position

collector / SVP / Corresponding author / physicist / electrical charge conductor / /

Product

Hurricane software / Hurricane / /

Technology

semiconductor / condensation / simulation / /

URL

www.elsevier.com/locate/micron / /

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