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Electronics manufacturing / Automatic test pattern generation / Boundary scan / Joint Test Action Group / Scan chain / Fault coverage / In-circuit test / Logic simulation / Stuck-at fault / Electronic engineering / Electronics / Electronic design automation


Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . .
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Document Date: 2013-01-28 01:04:00


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File Size: 37,22 KB

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Company

Soft Test Inc. / /

Facility

Bridge Fault Model / /

Position

TAP Controller / /

ProgrammingLanguage

Hoc / /

Technology

Simulation / /

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