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Stuck-at fault
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#	Item
1	Proceedings of the International MultiConference of Engineers and Computer Scientists 2012 Vol II, IMECS 2012, March, 2012, Hong Kong A Concurrent Error Detection Based FaultTolerant 32 nm XOR-XNOR Circuit Implem Add to Reading List Source URL: www.bpti.lt Language: English - Date: 2013-12-16 08:28:43 Logic gates Digital electronics Electronic design XOR gate XNOR gate Stuck-at fault Fault model Transistor fault OR gate Fault tolerance Pass transistor logic Exclusive or
2	Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . . Add to Reading List Source URL: www.soft-test.com Language: English - Date: 2013-02-18 04:29:00 Electronics manufacturing Automatic test pattern generation Boundary scan Joint Test Action Group Scan chain Fault coverage In-circuit test Logic simulation Stuck-at fault Electronic engineering Electronics Electronic design automation
3	Table of Contents Introduction to DFT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-1 Objectives: . . . . . . . . . . . . . . . . . . . . . . . . Add to Reading List Source URL: www.soft-test.com Language: English - Date: 2013-01-28 01:04:00 Electronics manufacturing Automatic test pattern generation Boundary scan Joint Test Action Group Scan chain Fault coverage In-circuit test Logic simulation Stuck-at fault Electronic engineering Electronics Electronic design automation
4	JOURNAL OF ELECTRONIC TESTING: Theory and Applications, 3, [removed]1992 Kluwer Academic Publishers, Boston. Manufactured in The Netherlands. An Efficient Design of Embedded Memories and their Testability Analysi Add to Reading List Source URL: deepblue.lib.umich.edu Language: English - Date: 2015-01-19 11:48:27 Markov models Markov processes Electronic design Integrated circuits Markov chain Linear feedback shift register Stuck-at fault Dynamic random-access memory Fault coverage Electronic engineering Electronic design automation Electronics
5	Computer Science Technical Report Antirandom Test Patterns Generation Tool Huifang Yin Computer Science Dept. Add to Reading List Source URL: www.cs.colostate.edu Language: English - Date: 1999-06-22 14:29:28 Electronics Integrated circuits Electronic design Digital electronics Iddq testing Fault coverage Stuck-at fault Reliability engineering Automatic test pattern generation Electronic engineering Electronic design automation Design
6	ICCD 2004Iccd.ks[removed]Team Photos Center for Add to Reading List Source URL: crc.stanford.edu Language: English - Date: 2006-04-05 02:15:53 Technology Electronic design automation Design for X Electronic design Reliability engineering Survival analysis Stuck-at fault Reliability Wafer testing Electronic engineering Design Semiconductor device fabrication