University of Michigan / J.H. PATEL Coordinated Science Laboratory / /
IndustryTerm
test algorithms / deterministic algorithms / functional test algorithms / memory chip / computer systems / analytical solutions / /
Organization
University of Michigan / Ann Arbor / J.H. PATEL Coordinated Science Laboratory / National Science Foundation / MAZUMDER Department of Electrical Engineering and Computer Science / /
Position
Editor / Markov Model for Coupling Fault d /\ Fig / wb / Markov model for the fault / /
JOURNAL OF ELECTRONIC TESTING: Theory and Applications, 3, [removed]1992 Kluwer Academic Publishers, Boston. Manufactured in The Netherlands. An Efficient Design of Embedded Memories and their Testability Analysi