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Scientific method / Magnetic force microscope / Kelvin probe force microscope / Atomic force microscopy / Microscopy / Scanning tunneling microscope / Scanning capacitance microscopy / Nanometrology / Chemical force microscopy / Scanning probe microscopy / Science / Chemistry


Document Date: 2011-11-27 18:00:00

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File Size: 835,71 KB

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City

Tokyo / /

Company

Park Systems Japan Park Systems Singapore Park Systems Inc. / Scanner Bow Park Systems / Piezo Creep Park Systems / Sample Preservation Park Systems / Chiyoda / Park Systems Corp. / VERTEX / /

Currency

VND / /

Facility

factory Position Error / NK Dai-ichi Bldg. / /

/

IndustryTerm

high-resolution imaging / non-destructive imaging / conventional systems / Software flattening / in-liquid imaging / nanoscale imaging / liquid cell applications / data analysis software / control electronics / imaging / embedded digital signal processing capability / software processing / data acquisition software / travel range / liquid/gas perfusion / high speed electronics / non-contact mode imaging / stage travel / low noise signal processing / cantilever carrier / electronics / bit digital electronics / digital signal processing capability / forward sine-scan algorithm / buffer solutions / repetitive imaging / /

Organization

pN Force / /

Person

Carbonate Scan / Kelvin Probe / Steel Al Alloy / Raman Spectroscopy / Easy Tip / /

/

Position

Intuitive Laser Beam Alignment The AFM head / Long Travel Head / NX electronics controller / AFM head / same NX electronics controller / SLD Head / small forward / conductor / Luminescence Diode Head / optics The AFM head / Automation The controller / controller / super conductor / /

Product

Samsung NX10 Digital Camera / Crosstalk Elimination / /

ProvinceOrState

California / /

Technology

forward sine-scan algorithm / ADC / laser / Dielectric / spectroscopy / DSP / Electrochemistry / /

URL

www.parkAFM.co.jp / www.parkAFM.com / /

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