Chemical force microscopy

Results: 23



#Item
1Photon Factory Activity Report 2004 #22 Part BSurface and Interface 7C/2003G301  A Challenge to XANAM- a New Nanoscale Chemical Mapping Microscopy

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 7C/2003G301 A Challenge to XANAM- a New Nanoscale Chemical Mapping Microscopy

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:29
2Photon Factory Activity Report 2006 #24 Part BSurface and Interface 7C/2005G201  Preparative study of XANAM surface chemical mapping

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 7C/2005G201 Preparative study of XANAM surface chemical mapping

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:38
3Photon Factory Activity Report 2005 #23Part BSurface and Interface 7C/2005G201  Improvement of XANAM apparatus for chemical mapping

Photon Factory Activity Report 2005 #23Part BSurface and Interface 7C/2005G201 Improvement of XANAM apparatus for chemical mapping

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:32:24
4

PDF Document

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
5

PDF Document

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-27 18:00:00
6Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P

Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
7Chemical Mechanical Polishing (CMP) Metrology with Advanced Surface Profiler >>> Figure 1. The key matrices of metal chemical mechanical

Chemical Mechanical Polishing (CMP) Metrology with Advanced Surface Profiler >>> Figure 1. The key matrices of metal chemical mechanical

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Source URL: www.nanowerk.com

Language: English - Date: 2011-11-12 18:00:00
8Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2

Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2

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Source URL: ntmdt.com

Language: English - Date: 2015-02-19 03:40:30
9Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2

Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 NT-MDT America, Tempe, AZ U.S.A. 2

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Source URL: www.ntmdt.com

Language: English - Date: 2015-02-19 03:40:30
10Finding a needle in a chemical haystack: tip-enhanced Raman scattering for studying carbon nanotubes mixtures

Finding a needle in a chemical haystack: tip-enhanced Raman scattering for studying carbon nanotubes mixtures

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Source URL: www.ntmdt.com

Language: English - Date: 2012-07-13 02:47:38