![Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism Physics / Technology / MOSFET / Capacitance / Depletion region / Diode / P–n junction / Capacitor / Field-effect transistor / Scanning probe microscopy / Scanning capacitance microscopy / Electromagnetism](https://www.pdfsearch.io/img/5ecb65b1691daca4bbe8415e0738f703.jpg)
| Document Date: 2009-12-27 18:00:00 Open Document File Size: 904,57 KBShare Result on Facebook
IndustryTerm metal-oxide-semiconductor field effect transistor / direct imaging / carrier concentration information / carrier concentration / characterization tools / keV energy / semiconductor device / conventional tools / sample imaging / conductive metal probe tip / twodimensional activated carrier concentration / imaging / semiconductor devices / Low carrier concentration / / OperatingSystem MNOS / / Person Ion Mass Spectroscopy / / Position semi-conductor / / ProgrammingLanguage DC / / Technology semiconductor / radiation / microwave / semiconductors / S/N / semiconductor devices / dielectric / / URL www.parkAFM.com / /
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