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Inorganic compounds / Semiconductor device fabrication / Ultraviolet radiation / Gallium nitride / Sputter deposition / Organic field-effect transistor / Sputtering / Thin film / Amorphous silicon / Chemistry / Thin films / Thin film deposition
Date: 2014-10-09 23:23:02
Inorganic compounds
Semiconductor device fabrication
Ultraviolet radiation
Gallium nitride
Sputter deposition
Organic field-effect transistor
Sputtering
Thin film
Amorphous silicon
Chemistry
Thin films
Thin film deposition

IEEE ELECTRON DEVICE LETTERS, VOL. 34, NO. 4, APRIL[removed]Bottom-Gate Thin-Film Transistors Based on GaN Active Channel Layer

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