2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample

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Date: 2008-01-29 12:03:00 Area Surface area Curvature Sphere Cone Angular resolution Atomic force microscopy Geometry Scanning probe microscopy Surfaces		2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample Add to Reading List Source URL: www.ntmdt.com Download Document from Source Website File Size: 219,87 KB Share Document on Facebook

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