![Area / Surface area / Curvature / Sphere / Cone / Angular resolution / Atomic force microscopy / Geometry / Scanning probe microscopy / Surfaces Area / Surface area / Curvature / Sphere / Cone / Angular resolution / Atomic force microscopy / Geometry / Scanning probe microscopy / Surfaces](https://www.pdfsearch.io/img/d8ee67b65c3bf9b24f3485e05fab6ea5.jpg) Date: 2008-01-29 12:03:00Area Surface area Curvature Sphere Cone Angular resolution Atomic force microscopy Geometry Scanning probe microscopy Surfaces | | 2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sampleAdd to Reading ListSource URL: www.ntmdt.comDownload Document from Source Website File Size: 219,87 KBShare Document on Facebook
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