2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample - Contact area - Document - PDFSEARCH.IO

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	2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample Add to Reading List Document Date: 2008-01-29 12:03:00 Open Document File Size: 219,87 KB Share Result on Facebook Company Hertz / / IndustryTerm problem solution / / / Position Major / / SocialTag Area Surface area Curvature Sphere Cone Angular resolution Atomic force microscopy Geometry Scanning probe microscopy Surfaces

2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sampleAdd to Reading List