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Physics / Electromigration / Power network design / Integrated circuit design / Current density / Reliability / Physical design / EM / Current crowding / Electronic engineering / Electronic design automation / Electromagnetism


White Paper Understand and Avoid Electromigration (EM) & IR-drop in Custom IP Blocks November 2011
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Document Date: 2014-11-07 14:37:36


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File Size: 678,86 KB

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