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Date: 2014-11-07 14:37:36Physics Electromigration Power network design Integrated circuit design Current density Reliability Physical design EM Current crowding Electronic engineering Electronic design automation Electromagnetism | White Paper Understand and Avoid Electromigration (EM) & IR-drop in Custom IP Blocks November 2011Add to Reading ListSource URL: www.synopsys.comDownload Document from Source WebsiteFile Size: 678,86 KBShare Document on Facebook |