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Electronic design / Chenming Hu / Phil Kaufman Award / BSIM / Multigate device / Transistor model / IEEE Council on Electronic Design Automation / Design Automation Conference / Design Automation and Test in Europe / Electronic engineering / Electrical engineering / Electronic design automation


NEWS RELEASE For more information, contact: Kristin Steen Public Relations for the IEEE Council on EDA[removed]
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Document Date: 2013-04-30 04:12:39

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