Focused ion beam preparation and characterization of single-crystal samples for high-pressure experiments in the diamond-anvil cell

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Date: 2012-01-31 11:29:41 Science Semiconductor device fabrication Thin film deposition Electron beam Microscopes Focused ion beam Transmission electron microscopy Electron microscope Brillouin scattering Scientific method Electron microscopy Physics		Focused ion beam preparation and characterization of single-crystal samples for high-pressure experiments in the diamond-anvil cell Add to Reading List Source URL: www.minsocam.org Download Document from Source Website File Size: 132,28 KB Share Document on Facebook

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