![Science / Semiconductor device fabrication / Thin film deposition / Electron beam / Microscopes / Focused ion beam / Transmission electron microscopy / Electron microscope / Brillouin scattering / Scientific method / Electron microscopy / Physics Science / Semiconductor device fabrication / Thin film deposition / Electron beam / Microscopes / Focused ion beam / Transmission electron microscopy / Electron microscope / Brillouin scattering / Scientific method / Electron microscopy / Physics](https://www.pdfsearch.io/img/208d93855a02127e3137e1b3e21e9481.jpg) Date: 2012-01-31 11:29:41Science Semiconductor device fabrication Thin film deposition Electron beam Microscopes Focused ion beam Transmission electron microscopy Electron microscope Brillouin scattering Scientific method Electron microscopy Physics | | Focused ion beam preparation and characterization of single-crystal samples for high-pressure experiments in the diamond-anvil cellAdd to Reading ListSource URL: www.minsocam.orgDownload Document from Source Website File Size: 132,28 KBShare Document on Facebook
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