Back to Results
First PageMeta Content
Science / Semiconductor device fabrication / Thin film deposition / Electron beam / Microscopes / Focused ion beam / Transmission electron microscopy / Electron microscope / Brillouin scattering / Scientific method / Electron microscopy / Physics


Focused ion beam preparation and characterization of single-crystal samples for high-pressure experiments in the diamond-anvil cell
Add to Reading List

Document Date: 2012-01-31 11:29:41

Open Document

File Size: 132,28 KB

Share Result on Facebook

Currency

USD / /

/

IndustryTerm

chemical composition / /

Organization

Marquardt* and Katharina Marquardt German Research Centre for Geosciences GFZ / /

Person

Volume / Earth / Hauke Marquardt / Katharina Marquardt German / /

Position

Mineralogist / candidate / /

Technology

spectroscopy / /

URL

http /

SocialTag