Edward J. McCluskey

Results: 8



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1A Memory Coherence Technique for Online Transient Error Recovery of FPGA Configurations Wei-Je Huang and Edward J. McCluskey CENTER FOR RELIABLE COMPUTING Computer Systems Laboratory, Department of Electrical Engineering

A Memory Coherence Technique for Online Transient Error Recovery of FPGA Configurations Wei-Je Huang and Edward J. McCluskey CENTER FOR RELIABLE COMPUTING Computer Systems Laboratory, Department of Electrical Engineering

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Source URL: crc.stanford.edu

Language: English - Date: 2015-09-30 01:46:56
    2IDDQ Data Analysis Using Current Signature James C.M. Li and Edward J. McCluskey CRC-Stanford University Stanford, CA 94305

    IDDQ Data Analysis Using Current Signature James C.M. Li and Edward J. McCluskey CRC-Stanford University Stanford, CA 94305

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    Source URL: crc.stanford.edu

    Language: English - Date: 2015-09-30 01:46:56
      3Performance Evaluation of Checksum-Based ABFT∗ Ahmad A. Al-Yamani, Nahmsuk Oh and Edward J. McCluskey Center for Reliable Computing – Stanford University, Stanford, California {alyamani, nsoh, } A

      Performance Evaluation of Checksum-Based ABFT∗ Ahmad A. Al-Yamani, Nahmsuk Oh and Edward J. McCluskey Center for Reliable Computing – Stanford University, Stanford, California {alyamani, nsoh, } A

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      Source URL: crc.stanford.edu

      Language: English - Date: 2015-09-30 01:46:57
        4Seed Encoding with LFSRs and Cellular Automata Ahmad A. Al-Yamani and Edward J. McCluskey Center for Reliable Computing Stanford University, Stanford, CA {alyamani, ejm}@crc.stanford.edu

        Seed Encoding with LFSRs and Cellular Automata Ahmad A. Al-Yamani and Edward J. McCluskey Center for Reliable Computing Stanford University, Stanford, CA {alyamani, ejm}@crc.stanford.edu

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        Source URL: crc.stanford.edu

        Language: English - Date: 2015-09-30 01:46:57
          5Experimental Results for IDDQ and VLV Testing Jonathan T.-Y. Chang* , Chao-Wen Tseng* , Yi-Chin Chu* , Sanjay Wattal* , Mike Purtell* *, and Edward J. McCluskey* *  Center for Reliable Computing

          Experimental Results for IDDQ and VLV Testing Jonathan T.-Y. Chang* , Chao-Wen Tseng* , Yi-Chin Chu* , Sanjay Wattal* , Mike Purtell* *, and Edward J. McCluskey* * Center for Reliable Computing

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          Source URL: crc.stanford.edu

          Language: English - Date: 2015-09-30 01:46:56
            6Detecting Bridging Faults in Dynamic CMOS Circuits Jonathan T.-Y. Chang and Edward J. McCluskey Center for Reliable Computing Stanford University Gates Hall 2A Stanford, CA 94305

            Detecting Bridging Faults in Dynamic CMOS Circuits Jonathan T.-Y. Chang and Edward J. McCluskey Center for Reliable Computing Stanford University Gates Hall 2A Stanford, CA 94305

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            Source URL: crc.stanford.edu

            Language: English - Date: 2015-09-30 01:46:56
              7

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              Source URL: www.ieee.org

              Language: English
              8

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              Source URL: www.ieee.org

              Language: English