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Semiconductor device fabrication / Electronics manufacturing / Electronic design / Electrical engineering / Printed circuit board / Reliability / Flip chip / Chip scale package / Electronic engineering / Electronics / Electromagnetism


Die Carrier Temporary Reusable Packages S e t t i n g t h e S t a n d a r d s f o r To m o r r ow Die Level Burn-in and Test
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Document Date: 2009-03-18 18:13:31


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File Size: 135,99 KB

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City

Fremont / /

Company

Aehr Test Systems GmbH / Aehr Test Systems Taiwan / R T E R S Aehr Test Systems / Corporate Headquarters Aehr Test Systems / /

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IndustryTerm

metal / burn-in systems / carrier system / carrier base / carrier lid / carrier loading / die carrier / /

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Position

COB / /

ProvinceOrState

California / /

Technology

semiconductor / board design / /

URL

www.aehr.com / /

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