![Semiconductor device fabrication / Science / Thin film deposition / Physics / Electromagnetism / Electron beam lithography / Focused ion beam / Resonator / Electron microscope / Materials science / Microtechnology / Electron microscopy Semiconductor device fabrication / Science / Thin film deposition / Physics / Electromagnetism / Electron beam lithography / Focused ion beam / Resonator / Electron microscope / Materials science / Microtechnology / Electron microscopy](https://www.pdfsearch.io/img/9ad9153a518eccb950b34b153f7e13eb.jpg) Date: 2014-08-14 14:18:10Semiconductor device fabrication Science Thin film deposition Physics Electromagnetism Electron beam lithography Focused ion beam Resonator Electron microscope Materials science Microtechnology Electron microscopy | | Supplementary Material for “Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits” C. M. Quintana,1 A. Megrant,1 Z. Chen,1 A. Dunsworth,1 B. Chiaro,1 R. Barends,1 Add to Reading ListSource URL: web.physics.ucsb.eduDownload Document from Source Website File Size: 200,09 KBShare Document on Facebook
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